Declassified document AECD (series). 2792. Trace analysis of silicon in vanadium and uranium, spectrophotometry method [with list of literature cited]: by Ruth Guenther, Richard H. Gale.
Publication Title:
Trace analysis of silicon in vanadium and uranium, spectrophotometry method [with list of literature cited]: by Ruth Guenther, Richard H. Gale.
Display Title:
Declassified document AECD (series). 2792. Trace analysis of silicon in vanadium and uranium, spectrophotometry method [with list of literature cited]: by Ruth Guenther, Richard H. Gale.
Series Title:
Declassified document AECD (series).
Corporate Agency Authors:
Atomic Energy Commission
Sort Author:
Atomic Energy Commission
Authors:
Guenther, Ruth and Gale, Richard H.
Date:
[Mar. 16, 1950.]
Publish Date ISO Format:
1950-03-16T00:00:00Z
Publication Start:
19500316
Publication End:
19500316
Corporate/Agency Author:
Atomic Energy Commission
Publication month:
10
Publication year:
1950
Publication place:
Oak Ridge. Tenn.
SuDoc number:
Y 3.At 7:8/(nos.)
Description:
[1]+9 p. 4°
Notes:
(Knolis Atomic Power Laboratory.) [Manuscript date, Nov. 8, 1949, declassified Jan. 30, 1950.] and (Technical Information Division.) [Processed.]
Notes:
(Technical Information Division.) [Processed.] ‡ Official Use. Not Available.