AEC research reports. ISC-926. Measurement of minority carrier lifetimes in semiconductors [with list of literature cited]; by Yuichiro Nishina, G. C. Danielson.
Publication Title:
Measurement of minority carrier lifetimes in semiconductors [with list of literature cited]; by Yuichiro Nishina, G. C. Danielson.
Display Title:
AEC research reports. ISC-926. Measurement of minority carrier lifetimes in semiconductors [with list of literature cited]; by Yuichiro Nishina, G. C. Danielson.
Series Title:
AEC research reports.
Corporate Agency Authors:
Atomic Energy Commission
Sort Author:
Atomic Energy Commission
Authors:
Nishina, Yuichiro and Danielson, G. C.
Date:
Mar. 1957
Publish Date ISO Format:
1957-03-01T00:00:00Z
Publication Start:
19570301
Publication End:
19570331
Corporate/Agency Author:
Atomic Energy Commission
Publication month:
10
Publication year:
1957
SuDoc number:
Y 3.At 7:22/(letters-nos.)
Description:
iv+35 p. il. 4°
Notes:
(Ames Laboratory, Iowa State College, Ames, Iowa.) [Processed.]
Notes:
(Ames Laboratory, Iowa State College, Ames, Iowa.) [Processed.] Φ For Sale by OTS, Commerce Dept. Paper, $1.25.