Technical notes. 199. Correction factor tables for 4-point probe resistivity measurements on thin, circular semiconductor samples [with list of references; by] Lydon J. Swartzendruber.
Publication Title:
Correction factor tables for 4-point probe resistivity measurements on thin, circular semiconductor samples [with list of references; by] Lydon J. Swartzendruber.
Display Title:
Technical notes. 199. Correction factor tables for 4-point probe resistivity measurements on thin, circular semiconductor samples [with list of references; by] Lydon J. Swartzendruber.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Swartzendruber, Lydon J.
Date:
Apr. 15, 1964
Publish Date ISO Format:
1964-04-15T00:00:00Z
Publication Start:
19640415
Publication End:
19640415
Corporate/Agency Author:
National Bureau of Standards
Publication month:
9
Publication year:
1964
SuDoc number:
C 13.46:(nos.)
Description:
[1]+vii + 34 p. il. 4°
Notes:
• Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper. 30c. and • Sent to Depository Libraries. Item 249-A