Technical notes. 241. Calculations for comparing 2-point and 4-point probe resistivity measurements on rectangular bar-shaped semiconductor samples; [by] Lyndon J. Swartzendruber.
Publication Title:
Calculations for comparing 2-point and 4-point probe resistivity measurements on rectangular bar-shaped semiconductor samples; [by] Lyndon J. Swartzendruber.
Display Title:
Technical notes. 241. Calculations for comparing 2-point and 4-point probe resistivity measurements on rectangular bar-shaped semiconductor samples; [by] Lyndon J. Swartzendruber.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Swartzendruber, Lyndon J.
Date:
June 1, 1964
Publish Date ISO Format:
1964-06-01T00:00:00Z
Publication Start:
19640601
Publication End:
19640601
Corporate/Agency Author:
National Bureau of Standards
Publication month:
7
Publication year:
1964
SuDoc number:
C 13.46:(nos.)
Description:
ii +25 p. il. 4°
Notes:
• Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 25c. and • Sent to Depository Libraries. Item 249-A