Technical notes. 242. Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films [with list of references; by] Frank L. McCrackin and James P. Colson.
Publication Title:
Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films [with list of references; by] Frank L. McCrackin and James P. Colson.
Display Title:
Technical notes. 242. Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films [with list of references; by] Frank L. McCrackin and James P. Colson.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
McCrackin, Frank L. and Colson, James P.
Date:
May 27, 1964
Publish Date ISO Format:
1964-05-27T00:00:00Z
Publication Start:
19640527
Publication End:
19640527
Corporate/Agency Author:
National Bureau of Standards
Publication month:
8
Publication year:
1964
SuDoc number:
C 13.46:(nos.)
Description:
11+42 p. il. 4°
Notes:
• Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 30c. and • Sent to Depository Libraries. Item 249-A