NASA technical note TN (series). D-2817. Effect of 40-MeV protons on semiconductors as determined with improved method of measuring diffusion length of minority carriers [with list of references]; by Marvin E. Beatty and Gerald F. Hill.
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Effect of 40-MeV protons on semiconductors as determined with improved method of measuring diffusion length of minority carriers [with list of references]; by Marvin E. Beatty and Gerald F. Hill.
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NASA technical note TN (series). D-2817. Effect of 40-MeV protons on semiconductors as determined with improved method of measuring diffusion length of minority carriers [with list of references]; by Marvin E. Beatty and Gerald F. Hill.