NASA technical note TN (series). D-3658. Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis [with list of references]; by L. Frederick Norris, Walter S. Cremens, and John W. Weeton.

Publication Title:
Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis [with list of references]; by L. Frederick Norris, Walter S. Cremens, and John W. Weeton.
Display Title:
NASA technical note TN (series). D-3658. Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis [with list of references]; by L. Frederick Norris, Walter S. Cremens, and John W. Weeton.
Series Title:
NASA technical note TN (series).
Corporate Agency Authors:
National Aeronautics and Space Administration
Sort Author:
National Aeronautics and Space Administration
Authors:
Norris, L. Frederick, Cremens, Walter S., and Weeton, John W.
Author place:
Washington, D.C.
Author zip:
20546
Date:
Oct. 1966
Publish Date ISO Format:
1966-10-01T00:00:00Z
Publication Start:
19661001
Publication End:
19661031
Corporate/Agency Author:
National Aeronautics and Space Administration
Publication month:
3
Publication year:
1966
SuDoc number:
NAS 1.14:D-(nos.)
Description:
cover title, [1]+6 p. il. 4°
Notes:
Φ For Sale by OTS, Commerce Dept. Paper, $1.00.
Availability:
Φ For Sale by OTS, Commerce Dept. Paper, $1.00.
Monthly Catalog date:
December 1966
Monthly Catalog issue number:
863
Monthly Catalog page number:
1
Monthly Catalog issue date:
1966-12-01T00:00:00Z
Monthly Catalog entry number:
17921
Record start page number:
59

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