NASA contractor report CR (series). 721. High reliability screening of semiconductor and integrated circuit devices [with bibliography]; by J. Lombard, L. McDonough, and H. Padden.
Publication Title:
High reliability screening of semiconductor and integrated circuit devices [with bibliography]; by J. Lombard, L. McDonough, and H. Padden.
Display Title:
NASA contractor report CR (series). 721. High reliability screening of semiconductor and integrated circuit devices [with bibliography]; by J. Lombard, L. McDonough, and H. Padden.
Series Title:
NASA contractor report CR (series).
Corporate Agency Authors:
National Aeronautics and Space Administration
Sort Author:
National Aeronautics and Space Administration
Authors:
Lombard, J., McDonough, L., and Padden, H.
Author place:
Washington, D.C.
Author zip:
20546
Date:
Apr. 1967
Publish Date ISO Format:
1967-04-01T00:00:00Z
Publication Start:
19670401
Publication End:
19670430
Corporate/Agency Author:
National Aeronautics and Space Administration
Publication month:
9
Publication year:
1967
SuDoc number:
NAS 1.26:(nos.)
Description:
cover title, xiii+150 p. il. 4°
Notes:
[Prepared under contract NAS 5-9689 by Grumman Aircraft Engineering Corporation, Bethpage, N.Y.]
Notes:
[Prepared under contract NAS 5-9689 by Grumman Aircraft Engineering Corporation, Bethpage, N.Y.] Φ For Sale by OTS, Commerce Dept. Paper $3.25.