AEC-NASA tech briefs. 67-10186. Alpha particle backscattering measurements used for chemical analysis of surfaces.
Publication Title:
Alpha particle backscattering measurements used for chemical analysis of surfaces.
Display Title:
AEC-NASA tech briefs. 67-10186. Alpha particle backscattering measurements used for chemical analysis of surfaces.
Series Title:
AEC-NASA tech briefs.
Corporate Agency Authors:
National Aeronautics and Space Administration
Sort Author:
National Aeronautics and Space Administration
Author place:
Washington, D.C.
Author zip:
20546
Date:
June 1967
Publish Date ISO Format:
1967-06-01T00:00:00Z
Publication Start:
19670601
Publication End:
19670630
Corporate/Agency Author:
National Aeronautics and Space Administration
Publication month:
7
Publication year:
1967
SuDoc number:
NAS 1.29/2:(nos.)
Description:
[2] p. il. 4°
Notes:
([ARG-116.]) and [Descriptions of innovations resulting from research and development program of AEC or from AEC-NASA interagency efforts.]
Notes:
[Descriptions of innovations resulting from research and development program of AEC or from AEC-NASA interagency efforts.] Φ For Sale by OTS, Commerce Dept. Paper, each 15c.
Availability:
Φ For Sale by OTS, Commerce Dept. Paper, each 15c.