NASA tech briefs. 68-10001. DC pin-to-pin testing of integrated circuits.
Publication Title:
DC pin-to-pin testing of integrated circuits.
Display Title:
NASA tech briefs. 68-10001. DC pin-to-pin testing of integrated circuits.
Series Title:
NASA tech briefs.
Corporate Agency Authors:
National Aeronautics and Space Administration
Sort Author:
National Aeronautics and Space Administration
Author place:
Washington, DC
Author zip:
20546
Date:
Jan. 1968
Publish Date ISO Format:
1968-01-01T00:00:00Z
Publication Start:
19680101
Publication End:
19680131
Corporate/Agency Author:
National Aeronautics and Space Administration
Publication month:
12
Publication year:
1968
SuDoc number:
NAS 1.29:(nos.)
Description:
1 p. 4°
Notes:
(GSC-10284.) and [Issued by Technology Utilization Division to summarize specific technical innovations derived from the space program. Issued with perforations.]
Notes:
[Issued by Technology Utilization Division to summarize specific technical innovations derived from the space program. Issued with perforations.] Φ For Sale by OTS, Commerce Dept. Paper, each 15c.
Availability:
Φ For Sale by OTS, Commerce Dept. Paper, each 15c.