Technical notes. 445. Bibliography on methods for measurement of inhomogeneities in semiconductors, 1953-67 [by] Harry A. Schafft and Susan Gayle Needham.
Publication Title:
Bibliography on methods for measurement of inhomogeneities in semiconductors, 1953-67 [by] Harry A. Schafft and Susan Gayle Needham.
Display Title:
Technical notes. 445. Bibliography on methods for measurement of inhomogeneities in semiconductors, 1953-67 [by] Harry A. Schafft and Susan Gayle Needham.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Schafft, Harry A. and Needham, Susan Gayle
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
May 1968
Publish Date ISO Format:
1968-05-01T00:00:00Z
Publication Start:
19680501
Publication End:
19680531
Corporate/Agency Author:
National Bureau of Standards
Publication month:
8
Publication year:
1968
SuDoc number:
C 13.46:(nos.)
Description:
ii+45 p. 4°
Notes:
(Electronic Instrumentation Division, Institute for Applied Technology.) [Includes list of NBS technical publications on p. 3 of cover.]
Notes:
(Electronic Instrumentation Division, Institute for Applied Technology.) [Includes list of NBS technical publications on p. 3 of cover.] • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 35c. and • Sent to Depository Libraries. Item 249-A