Technical notes. 475. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Oct. 1-Dec. 31, 1968; edited by W. Murray Bullis.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Oct. 1-Dec. 31, 1968; edited by W. Murray Bullis.
Display Title:
Technical notes. 475. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Oct. 1-Dec. 31, 1968; edited by W. Murray Bullis.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, W. Murray
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Feb. 1969
Publish Date ISO Format:
1969-02-01T00:00:00Z
Publication Start:
19690201
Publication End:
19690228
Corporate/Agency Author:
National Bureau of Standards
Publication month:
11
Publication year:
1969
SuDoc number:
C 13.46:(nos.)
Description:
iv+35 p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly supported by Defense Atomic Support Agency, U.S. Naval Ammunition Depot, Crane, Ind., and National Aeronautics and Space Administration.]
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly supported by Defense Atomic Support Agency, U.S. Naval Ammunition Depot, Crane, Ind., and National Aeronautics and Space Administration.] • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper,45c. and • Sent to Depository Libraries. Item 249-A