NASA technical note TN (series). D—5125. On the resolution and image intensity of field-ion microscope [with list of references]; by Victor G. Welzer and Americo F. Forestieri.

Publication Title:
On the resolution and image intensity of field-ion microscope [with list of references]; by Victor G. Welzer and Americo F. Forestieri.
Display Title:
NASA technical note TN (series). D—5125. On the resolution and image intensity of field-ion microscope [with list of references]; by Victor G. Welzer and Americo F. Forestieri.
Series Title:
NASA technical note TN (series).
Corporate Agency Authors:
National Aeronautics and Space Administration
Sort Author:
National Aeronautics and Space Administration
Authors:
Welzer, Victor G. and Forestieri, Americo F.
Author place:
Washington, DC
Author zip:
20546
Date:
Mar. 1969
Publish Date ISO Format:
1969-03-01T00:00:00Z
Publication Start:
19690301
Publication End:
19690331
Corporate/Agency Author:
National Aeronautics and Space Administration
Publication month:
10
Publication year:
1969
SuDoc number:
NAS 1.14:D—(nos.)
Description:
cover title, ii+ 14 p. il. 4°
Notes:
Φ For Sale by OTS, Commerce Dept. Paper, $3.00.
Availability:
Φ For Sale by OTS, Commerce Dept. Paper, $3.00.
Monthly Catalog date:
May 1969
Monthly Catalog issue number:
892
Monthly Catalog page number:
1
Monthly Catalog issue date:
1969-05-01T00:00:00Z
Monthly Catalog entry number:
7291
Record start page number:
60

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