Technical notes. 495. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Apr. 1-June 30, 1969; edited by W. Murray Bullis.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Apr. 1-June 30, 1969; edited by W. Murray Bullis.
Display Title:
Technical notes. 495. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Apr. 1-June 30, 1969; edited by W. Murray Bullis.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, W. Murray
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Sept. 1969
Publish Date ISO Format:
1969-09-01T00:00:00Z
Publication Start:
19690901
Publication End:
19690930
Corporate/Agency Author:
National Bureau of Standards
Publication month:
4
Publication year:
1969
SuDoc number:
C 13.46:(nos.)
Description:
iii+43 p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly supported by Defense Atomic Support Agency, Navy Strategic Systems Project Oflice, and National Aeronautics and Space Administration.]
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly supported by Defense Atomic Support Agency, Navy Strategic Systems Project Oflice, and National Aeronautics and Space Administration.] • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 50c. and • Sent to Depository Libraries. Item 249-A