- Publication Title:
- Test methods for semiconductor devices.
- Display Title:
- Military standard MIL-STD (series). 750B. Test methods for semiconductor devices.
- Series Title:
- Military standard MIL-STD (series).
- Corporate Agency Authors:
- Defense Department
- Sort Author:
- Defense Department
- Author place:
- Washington, DC
- Author zip:
- 20301
- Date:
- Feb. 27, 1970
- Publish Date ISO Format:
- 1970-02-27T00:00:00Z
- Publication Start:
- 19700227
- Publication End:
- 19700227
- Corporate/Agency Author:
- Defense Department
- Publication month:
- 11
- Publication year:
- 1970
- SuDoc number:
- D 7.10:(nos.)
- Description:
- 320 p. il. 4°
- Notes:
- (FSC 5961.) [Supersedes 750A, May 11, 1964.] and [Issued with perforations.]
- Notes:
- [Issued with perforations.] • Sent to Depository Libraries. tem 314-J
- Availability:
- ‡ Official Use. Not Available. and • Sent to Depository Libraries. tem 314-J
- GPO Item number:
- 314-J
- Monthly Catalog date:
- June 1970
- Monthly Catalog issue number:
- 905
- Monthly Catalog page number:
- 1
- Monthly Catalog issue date:
- 1970-06-01T00:00:00Z
- Monthly Catalog entry number:
- 8484
- Record start page number:
- 42