Technical notes. 527. Methods of measurements for semiconductor materials, process control, and devices, quarterly report. Oct. 1-Dec. 31, 1969 [with lists of references]: edited by W. Murray Bullis.
Publication Title:
Methods of measurements for semiconductor materials, process control, and devices, quarterly report. Oct. 1-Dec. 31, 1969 [with lists of references]: edited by W. Murray Bullis.
Display Title:
Technical notes. 527. Methods of measurements for semiconductor materials, process control, and devices, quarterly report. Oct. 1-Dec. 31, 1969 [with lists of references]: edited by W. Murray Bullis.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, W. Murray
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
May 1970
Publish Date ISO Format:
1970-05-01T00:00:00Z
Publication Start:
19700501
Publication End:
19700531
Corporate/Agency Author:
National Bureau of Standards
Publication month:
8
Publication year:
1970
SuDoc number:
C 13.46:(nos.)
Description:
iv+58 p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly sponsored by National Bureau of Standards. Defense Atomic Support Agency, U.S. Navy strategic Systems Project Office and National Aeronautics and Space Administration.]
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly sponsored by National Bureau of Standards. Defense Atomic Support Agency, U.S. Navy strategic Systems Project Office and National Aeronautics and Space Administration.] • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 60c. and • Sent to Depository Libraries. Item 249-A