NASA technical note TN (series). D-5732. Effects of nuclear radiation on high-reliability silicon power diode: 2, Analysis of forward electrical characteristics [with list of references]; by Julian F. Been.

Publication Title:
Effects of nuclear radiation on high-reliability silicon power diode: 2, Analysis of forward electrical characteristics [with list of references]; by Julian F. Been.
Display Title:
NASA technical note TN (series). D-5732. Effects of nuclear radiation on high-reliability silicon power diode: 2, Analysis of forward electrical characteristics [with list of references]; by Julian F. Been.
Series Title:
NASA technical note TN (series).
Corporate Agency Authors:
National Aeronautics and Space Administration
Sort Author:
National Aeronautics and Space Administration
Authors:
Been, Julian F.
Author place:
Washington, DC
Author zip:
20546
Date:
Apr. 1970
Publish Date ISO Format:
1970-04-01T00:00:00Z
Publication Start:
19700401
Publication End:
19700430
Corporate/Agency Author:
National Aeronautics and Space Administration
Publication month:
9
Publication year:
1970
SuDoc number:
NAS 1.14:D-(nos.)
Description:
cover title, [1]+26 p. il. 4°
Notes:
Φ For Sale by OTS, Commerce Dept. Paper, $3.00.
Availability:
Φ For Sale by OTS, Commerce Dept. Paper, $3.00.
Monthly Catalog date:
August 1970
Monthly Catalog issue number:
907
Monthly Catalog page number:
1
Monthly Catalog issue date:
1970-08-01T00:00:00Z
Monthly Catalog entry number:
11637
Record start page number:
68

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