1535. Measurement and analysis of pilot scanning and control behavior during simulated Instrument approaches [with list of references]; by David H. Weir and Richard H. Klein.
Publication Title:
Measurement and analysis of pilot scanning and control behavior during simulated Instrument approaches [with list of references]; by David H. Weir and Richard H. Klein.
Display Title:
1535. Measurement and analysis of pilot scanning and control behavior during simulated Instrument approaches [with list of references]; by David H. Weir and Richard H. Klein.
Corporate Agency Authors:
National Aeronautics and Space Administration
Sort Author:
National Aeronautics and Space Administration
Authors:
Weir, David H. and Klein, Richard H.
Author place:
Washington, DC
Author zip:
20546
Date:
June 1970
Publish Date ISO Format:
1970-06-01T00:00:00Z
Publication Start:
19700601
Publication End:
19700630
Corporate/Agency Author:
National Aeronautics and Space Administration
Publication month:
7
Publication year:
1970
Description:
cover title, [1261 p. il. 4°
Notes:
[Prepared under contract NAS 2-3746 by Systems Technology, Inc., Hawthorne, Calif. Issued by originator as Technical report 170-4.] and NASA contractor report CR (series). NAS 1.26: (nos.)
Notes:
NASA contractor report CR (series). NAS 1.26: (nos.) Φ For Sale by OTS, Commerce Dept. Paper, $3.00.