Technical notes. 555. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Jan. 1-Mar. 31, 1970; edited by W. Murray Bullis and A. J. Barody, jr.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Jan. 1-Mar. 31, 1970; edited by W. Murray Bullis and A. J. Barody, jr.
Display Title:
Technical notes. 555. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Jan. 1-Mar. 31, 1970; edited by W. Murray Bullis and A. J. Barody, jr.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, W. Murray and Barody, A. J. jr.
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Sept. 1970
Publish Date ISO Format:
1970-09-01T00:00:00Z
Publication Start:
19700901
Publication End:
19700930
Corporate/Agency Author:
National Bureau of Standards
Publication month:
4
Publication year:
1970
SuDoc number:
C 13.46:(nos.)
Description:
vi+58 p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly sponsored by National Bureau of Standards, Defense Atomic Support Agency, Navy Strategic Systems Project Oflice, Navy Electronic Systems Command, and National Aeronautics and Space Administration.]
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly sponsored by National Bureau of Standards, Defense Atomic Support Agency, Navy Strategic Systems Project Oflice, Navy Electronic Systems Command, and National Aeronautics and Space Administration.] • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 65c. and • Sent to Depository Libraries. Item 249-A