- Publication Title:
- Test methods for semiconductor devices, notice 2.
- Display Title:
- Military standard MIL-STD (series). 750B. Test methods for semiconductor devices, notice 2.
- Series Title:
- Military standard MIL-STD (series).
- Corporate Agency Authors:
- Defense Department
- Sort Author:
- Defense Department
- Author place:
- Washington, DC
- Author zip:
- 20301
- Date:
- Aug. 21, 1970
- Publish Date ISO Format:
- 1970-08-21T00:00:00Z
- Publication Start:
- 19700821
- Publication End:
- 19700821
- Corporate/Agency Author:
- Defense Department
- Publication month:
- 5
- Publication year:
- 1970
- SuDoc number:
- D 7.10:(nos.)
- Description:
- [6] p. il. 4°
- Notes:
- (FSC 5961.) and [Issued with perforations.]
- Notes:
- [Issued with perforations.] ‡ • Sent to Depository Libraries. Item 314-J
- Availability:
- ‡ • Sent to Depository Libraries. Item 314-J
- GPO Item number:
- 314-J
- Monthly Catalog date:
- December 1970
- Monthly Catalog issue number:
- 911
- Monthly Catalog page number:
- 1
- Monthly Catalog issue date:
- 1970-12-01T00:00:00Z
- Monthly Catalog entry number:
- 17742
- Record start page number:
- 22