Technical notes. 560. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Apr. 1-June 30, 1970 [with list of references]; edited by W. Murray Bullis and A. J. Baroody, jr.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Apr. 1-June 30, 1970 [with list of references]; edited by W. Murray Bullis and A. J. Baroody, jr.
Display Title:
Technical notes. 560. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Apr. 1-June 30, 1970 [with list of references]; edited by W. Murray Bullis and A. J. Baroody, jr.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, W. Murray and Baroody, A. J. jr.
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Nov. 1970
Publish Date ISO Format:
1970-11-01T00:00:00Z
Publication Start:
19701101
Publication End:
19701130
Corporate/Agency Author:
National Bureau of Standards
Publication month:
2
Publication year:
1970
SuDoc number:
C 13.46:(nos.)
Description:
vi+52 p. il. 4°
Notes:
[Jointly supported by Defense Atomic Support Agency, Navy Strategic Systems Project Office, Navy Electronic Systems Command and National Aeronautics and Space Administration. Includes list of joint program and current publications.]
Notes:
[Jointly supported by Defense Atomic Support Agency, Navy Strategic Systems Project Office, Navy Electronic Systems Command and National Aeronautics and Space Administration. Includes list of joint program and current publications.] • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 60c. and • Sent to Depository Libraries. Item 249-A