NASA technical note TN (series). D-6330. Effects of nuclear radiation on high-reliability silicon power diode: 3, Junction capacitance [with list of references]; by Julian F. Been, Ira T. Myers, and Michael P. Godlewski.

Publication Title:
Effects of nuclear radiation on high-reliability silicon power diode: 3, Junction capacitance [with list of references]; by Julian F. Been, Ira T. Myers, and Michael P. Godlewski.
Display Title:
NASA technical note TN (series). D-6330. Effects of nuclear radiation on high-reliability silicon power diode: 3, Junction capacitance [with list of references]; by Julian F. Been, Ira T. Myers, and Michael P. Godlewski.
Series Title:
NASA technical note TN (series).
Corporate Agency Authors:
National Aeronautics and Space Administration
Sort Author:
National Aeronautics and Space Administration
Authors:
Been, Julian F., Myers, Ira T., and Godlewski, Michael P.
Author place:
Washington, DC
Author zip:
20546
Date:
May 1971
Publish Date ISO Format:
1971-05-01T00:00:00Z
Publication Start:
19710501
Publication End:
19710531
Corporate/Agency Author:
National Aeronautics and Space Administration
Publication month:
8
Publication year:
1971
SuDoc number:
NAS 1.14:D-(nos.)
Description:
cover title, [1]+18 p. il. 4°
Notes:
Φ For Sale by OTS, Commerce Dept. Paper, $3.00.
Availability:
Φ For Sale by OTS, Commerce Dept. Paper, $3.00.
Monthly Catalog date:
July 1971
Monthly Catalog issue number:
918
Monthly Catalog page number:
1
Monthly Catalog issue date:
1971-07-01T00:00:00Z
Monthly Catalog entry number:
11510
Record start page number:
79

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