NASA technical note TN (series). D-6119. Quantitative determination of optical imperfections by mathematical analysis of Foucault knife-edge test pattern [with list of references]; by Samuel Katzoff.

Publication Title:
Quantitative determination of optical imperfections by mathematical analysis of Foucault knife-edge test pattern [with list of references]; by Samuel Katzoff.
Display Title:
NASA technical note TN (series). D-6119. Quantitative determination of optical imperfections by mathematical analysis of Foucault knife-edge test pattern [with list of references]; by Samuel Katzoff.
Series Title:
NASA technical note TN (series).
Corporate Agency Authors:
National Aeronautics and Space Administration
Sort Author:
National Aeronautics and Space Administration
Authors:
Katzoff, Samuel
Author place:
Washington, DC
Author zip:
20546
Date:
Aug. 1971
Publish Date ISO Format:
1971-08-01T00:00:00Z
Publication Start:
19710801
Publication End:
19710831
Corporate/Agency Author:
National Aeronautics and Space Administration
Publication month:
5
Publication year:
1971
SuDoc number:
NAS 1.14:D-(nos.)
Description:
cover title, [1]+50 p. il. 4°
Notes:
Φ For Sale by OTS, Commerce Dept. Paper, $3.00.
Availability:
Φ For Sale by OTS, Commerce Dept. Paper, $3.00.
Monthly Catalog date:
October 1971
Monthly Catalog issue number:
921
Monthly Catalog page number:
1
Monthly Catalog issue date:
1971-10-01T00:00:00Z
Monthly Catalog entry number:
15794
Record start page number:
76

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