Technical notes. 592. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Oct. 1-Dec. 31, 1970 [with lists of references]; edited by W. Murray Bullis.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Oct. 1-Dec. 31, 1970 [with lists of references]; edited by W. Murray Bullis.
Display Title:
Technical notes. 592. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Oct. 1-Dec. 31, 1970 [with lists of references]; edited by W. Murray Bullis.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, W. Murray
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Aug. 1971
Publish Date ISO Format:
1971-08-01T00:00:00Z
Publication Start:
19710801
Publication End:
19710831
Corporate/Agency Author:
National Bureau of Standards
Publication month:
5
Publication year:
1971
SuDoc number:
C 13.46:(nos.)
Description:
vi+67+[1] p. il. 4°
Notes:
(Electronic Technology Division.) [Jointly sponsored by National Bureau of Standards, Defense Atomic Support Agency, Navy Strategic Systems Project Office, Navy Electronic Systems Command, Atomic Energy Commission, National Aeronautics and Space Administration.]
Notes:
(Electronic Technology Division.) [Jointly sponsored by National Bureau of Standards, Defense Atomic Support Agency, Navy Strategic Systems Project Office, Navy Electronic Systems Command, Atomic Energy Commission, National Aeronautics and Space Administration.] • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 70c. (incorrectly given in publication as 50c.) and • Sent to Depository Libraries. Item 249-A