JPRS (series). 54096. Resonance method of measuring waveguide irregularities that cause small reflections, USSR [with bibliography]; by D. I. Voskresenskiy.
Publication Title:
Resonance method of measuring waveguide irregularities that cause small reflections, USSR [with bibliography]; by D. I. Voskresenskiy.
Display Title:
JPRS (series). 54096. Resonance method of measuring waveguide irregularities that cause small reflections, USSR [with bibliography]; by D. I. Voskresenskiy.
Series Title:
JPRS (series).
Corporate Agency Authors:
Joint Publications Research Service
Sort Author:
Joint Publications Research Service
Authors:
Voskresenskiy, D. I.
Author place:
1000 N. Glebe Rd., Arlington, VA
Author zip:
22201
Date:
Sept. 21, 1971
Publish Date ISO Format:
1971-09-21T00:00:00Z
Publication Start:
19710921
Publication End:
19710921
Corporate/Agency Author:
Joint Publications Research Service
Publication month:
4
Publication year:
1971
SuDoc number:
Y 3.J 66:13/(nos.)
Description:
cover title, 20 p. il. 4°
Notes:
[From Voprosy radiotekhniki i elektroniki sverkhvysokikh chastot (trudy), v. 98, 1958.]
Notes:
[From Voprosy radiotekhniki i elektroniki sverkhvysokikh chastot (trudy), v. 98, 1958.] Φ For Sale by OTS, Commerce Dept. Paper, each, $3.00.
Availability:
Φ For Sale by OTS, Commerce Dept. Paper, each, $3.00.