Technical notes. 702. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Apr. 1-June 30, 1971 [with list of references]; edited by W. Murray Bullis.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Apr. 1-June 30, 1971 [with list of references]; edited by W. Murray Bullis.
Display Title:
Technical notes. 702. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Apr. 1-June 30, 1971 [with list of references]; edited by W. Murray Bullis.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, W. Murray
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Dec. 1971
Publish Date ISO Format:
1971-12-01T00:00:00Z
Publication Start:
19711201
Publication End:
19711231
Corporate/Agency Author:
National Bureau of Standards
Publication month:
1
Publication year:
1971
SuDoc number:
C 13.46:(nos.)
Description:
vi+42 p. il. 4°
Notes:
• Item 249-A † Distribution Made by Issuing Office.
Availability:
* For Sale by Superintendent of Documents. Paper, 50c. and • Item 249-A † Distribution Made by Issuing Office.