Technical notes. 717. Methods of measurement for semiconductor materials, process control, and devices, quarterly report July 1-Sept. 30, 1971; W. Murray Bullis, editor.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report July 1-Sept. 30, 1971; W. Murray Bullis, editor.
Display Title:
Technical notes. 717. Methods of measurement for semiconductor materials, process control, and devices, quarterly report July 1-Sept. 30, 1971; W. Murray Bullis, editor.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Apr. 1972
Publish Date ISO Format:
1972-04-01T00:00:00Z
Publication Start:
19720401
Publication End:
19720430
Corporate/Agency Author:
National Bureau of Standards
Publication month:
9
Publication year:
1972
SuDoc number:
C 13.46:(nos.)
Description:
vi+48+[1] p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly sponsored by National Bureau of Standards, Defense Nuclear Agency, Navy Strategic System Project Office, Navy Electronics Systems Command, Air Force Weapons Laboratory, Air Force Cambridge Research Laboratories, Advanced Research Projects Agency, Atomic Energy Commission and National Aeronautics and Space Administration.]
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly sponsored by National Bureau of Standards, Defense Nuclear Agency, Navy Strategic System Project Office, Navy Electronics Systems Command, Air Force Weapons Laboratory, Air Force Cambridge Research Laboratories, Advanced Research Projects Agency, Atomic Energy Commission and National Aeronautics and Space Administration.] • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 55c. and • Sent to Depository Libraries. Item 249-A