- Publication Title:
- Test methods and procedures for microelectronics, notice 3.
- Display Title:
- Military standard MIL-STD (series). 883. Test methods and procedures for microelectronics, notice 3.
- Series Title:
- Military standard MIL-STD (series).
- Corporate Agency Authors:
- Defense Department
- Sort Author:
- Defense Department
- Author place:
- Washington, DC
- Author zip:
- 20301
- Date:
- July 3, 1972
- Publish Date ISO Format:
- 1972-07-03T00:00:00Z
- Publication Start:
- 19720703
- Publication End:
- 19720703
- Corporate/Agency Author:
- Defense Department
- Publication month:
- 6
- Publication year:
- 1972
- SuDoc number:
- D 7.10:(nos.)
- Description:
- [20] p. 4°
- Notes:
- (FSC 5962.) and [Issued with perforations.]
- Notes:
- [Issued with perforations.] † Distribution Made by Issuing Office.
- Availability:
- • Sent to Depository Libraries. Item 314-J and † Distribution Made by Issuing Office.
- GPO Item number:
- 314-J
- Monthly Catalog date:
- March 1973
- Monthly Catalog issue number:
- 938
- Monthly Catalog page number:
- 1
- Monthly Catalog issue date:
- 1973-03-01T00:00:00Z
- Monthly Catalog entry number:
- 20061
- Record start page number:
- 51