Army Electronics Command, Fort Monmouth, N.J.: Research and development technical report ECOM (series). 4005. Error estimate for thermal resistance measurements on uncoated Si microwave transistors as result of temperature gradients; by Herbert L. Mette.
Publication Title:
Error estimate for thermal resistance measurements on uncoated Si microwave transistors as result of temperature gradients; by Herbert L. Mette.
Display Title:
Army Electronics Command, Fort Monmouth, N.J.: Research and development technical report ECOM (series). 4005. Error estimate for thermal resistance measurements on uncoated Si microwave transistors as result of temperature gradients; by Herbert L. Mette.
Series Title:
Army Electronics Command, Fort Monmouth, N.J.: Research and development technical report ECOM (series).
Corporate Agency Authors:
Army Department and Defense Dept.
Sort Author:
Army Department
Authors:
Mette, Herbert L.
Author place:
Washington, DC
Author zip:
20310
Date:
Aug. 1972
Publish Date ISO Format:
1972-08-01T00:00:00Z
Publication Start:
19720801
Publication End:
19720831
Corporate/Agency Author:
Army Department
Publication month:
5
Publication year:
1972
SuDoc number:
D 111.9/4:(nos.)
Description:
iii+9+2 p. il. 4°
Notes:
[DA work unit 1S6 62708 A 440 03 231.] and (Reports control symbol OSD-1366.)
Notes:
(Reports control symbol OSD-1366.) ‡ Official Use. Not Available.