Army Electronics Command, Fort Monmouth, N.J.: Research and development technical report ECOM (series). 5432. Applications of dual parameter analyzers in solid-state laser tests [with list of literature cited]; by Stuart A. Schleusener, Kenneth O. White.
Publication Title:
Applications of dual parameter analyzers in solid-state laser tests [with list of literature cited]; by Stuart A. Schleusener, Kenneth O. White.
Display Title:
Army Electronics Command, Fort Monmouth, N.J.: Research and development technical report ECOM (series). 5432. Applications of dual parameter analyzers in solid-state laser tests [with list of literature cited]; by Stuart A. Schleusener, Kenneth O. White.
Series Title:
Army Electronics Command, Fort Monmouth, N.J.: Research and development technical report ECOM (series).
Corporate Agency Authors:
Army Department and Defense Dept.
Sort Author:
Army Department
Authors:
Schleusener, Stuart A. and White, Kenneth O.
Author place:
Washington, DC
Author zip:
20310
Date:
Apr. 1972
Publish Date ISO Format:
1972-04-01T00:00:00Z
Publication Start:
19720401
Publication End:
19720430
Corporate/Agency Author:
Army Department
Publication month:
9
Publication year:
1972
SuDoc number:
D 111.9/4:(nos.)
Description:
v+13+[2] p. il. 4°
Notes:
[DA task 1T061102B53A-19.] and (Reports control symbol OSD-1366.)
Notes:
(Reports control symbol OSD-1366.) ‡ Official Use. Not Available.