Technical notes. 743. Methods of measurement for semiconductor materials, process control, and devices, quarterly report Apr. 1-June 30, 1972 [with lists of references]; W. Murray Bullis, editor.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report Apr. 1-June 30, 1972 [with lists of references]; W. Murray Bullis, editor.
Display Title:
Technical notes. 743. Methods of measurement for semiconductor materials, process control, and devices, quarterly report Apr. 1-June 30, 1972 [with lists of references]; W. Murray Bullis, editor.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, W. Murray
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Dec. 1972
Publish Date ISO Format:
1972-12-01T00:00:00Z
Publication Start:
19721201
Publication End:
19721231
Corporate/Agency Author:
National Bureau of Standards
Publication month:
1
Publication year:
1972
SuDoc number:
C 13.46:(nos.)
Description:
vi+50+[1] p. il. 4°
Notes:
[Jointly supported by National Bureau of Standards, Defense Nuclear Agency, Navy Strategic Systems Project Office, Navy Electronic Systems Command, Air Force Weapons Laboratory, Air Force Cambridge Research Laboratories, Advanced Research Projects Agency, Atomic Energy Commission and National Aeronautics and Space Administration.]
Notes:
[Jointly supported by National Bureau of Standards, Defense Nuclear Agency, Navy Strategic Systems Project Office, Navy Electronic Systems Command, Air Force Weapons Laboratory, Air Force Cambridge Research Laboratories, Advanced Research Projects Agency, Atomic Energy Commission and National Aeronautics and Space Administration.] • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, $1.00. and • Sent to Depository Libraries. Item 249-A