Technical notes. 773. Methods of measurement for semiconductor materials, process control, and devices, quarterly report Oct. 1-Dec. 31, 1972 [with lists of references]; W. Murray Bullis, editor.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report Oct. 1-Dec. 31, 1972 [with lists of references]; W. Murray Bullis, editor.
Display Title:
Technical notes. 773. Methods of measurement for semiconductor materials, process control, and devices, quarterly report Oct. 1-Dec. 31, 1972 [with lists of references]; W. Murray Bullis, editor.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, W. Murray
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
June 1973
Publish Date ISO Format:
1973-06-01T00:00:00Z
Publication Start:
19730601
Publication End:
19730630
Corporate/Agency Author:
National Bureau of Standards
Publication month:
7
Publication year:
1973
SuDoc number:
C 13.46:(nos.)
Description:
v+50 p. il. 4°
Notes:
[Research jointly supported by National Bureau of Standards and other Government agencies.]
Notes:
[Research jointly supported by National Bureau of Standards and other Government agencies.] • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 80c. and • Sent to Depository Libraries. Item 249-A