Technical notes. 785. Scanning electron microscope examination of wire bonds from high-reliability devices [with list of references; by], Kathryn O. Leedy.
Publication Title:
Scanning electron microscope examination of wire bonds from high-reliability devices [with list of references; by], Kathryn O. Leedy.
Display Title:
Technical notes. 785. Scanning electron microscope examination of wire bonds from high-reliability devices [with list of references; by], Kathryn O. Leedy.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Leedy, Kathryn O.
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Aug. 1973
Publish Date ISO Format:
1973-08-01T00:00:00Z
Publication Start:
19730801
Publication End:
19730831
Corporate/Agency Author:
National Bureau of Standards
Publication month:
5
Publication year:
1973
SuDoc number:
C 13.46:(nos.)
Description:
vi +28+[1] p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.)
Notes:
(Electronic Technology Division, Institute for Applied Technology.) • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 55c. and • Sent to Depository Libraries. Item 249-A