Technical notes. 788. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Jan. 1-Mar. 31, 1973 [with list of references]; W. Murray Bullis, editor.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Jan. 1-Mar. 31, 1973 [with list of references]; W. Murray Bullis, editor.
Display Title:
Technical notes. 788. Methods of measurement for semiconductor materials, process control, and devices, quarterly report, Jan. 1-Mar. 31, 1973 [with list of references]; W. Murray Bullis, editor.
Series Title:
Technical notes.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, W. Murray
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Aug. 1973
Publish Date ISO Format:
1973-08-01T00:00:00Z
Publication Start:
19730801
Publication End:
19730831
Corporate/Agency Author:
National Bureau of Standards
Publication month:
5
Publication year:
1973
SuDoc number:
C 13.46:(nos.)
Description:
vii+70+[1] p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.)
Notes:
(Electronic Technology Division, Institute for Applied Technology.) • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 95c. and • Sent to Depository Libraries. Item 249-A