Technical note. 806. Methods of measurement for semiconductor materials, process control, and devices, quarterly report Apr. 1-June 30, 1973. [with lists of references]; W. Murray Bullis, editor.
Publication Title:
Methods of measurement for semiconductor materials, process control, and devices, quarterly report Apr. 1-June 30, 1973. [with lists of references]; W. Murray Bullis, editor.
Display Title:
Technical note. 806. Methods of measurement for semiconductor materials, process control, and devices, quarterly report Apr. 1-June 30, 1973. [with lists of references]; W. Murray Bullis, editor.
Series Title:
Technical note.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Bullis, Murray W.
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Nov. 1973
Publish Date ISO Format:
1973-11-01T00:00:00Z
Publication Start:
19731101
Publication End:
19731130
Corporate/Agency Author:
National Bureau of Standards
Publication month:
2
Publication year:
1973
SuDoc number:
C 13.46:806
Description:
vi+17+[1] p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Research jointly supported by National Bureau of Standards and other Government agencies.]
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Research jointly supported by National Bureau of Standards and other Government agencies.] * For Sale by Superintendent of Documents. Paper, $1.00. • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, $1.00. • Sent to Depository Libraries. Item 249-A