NASA technical note TN (series). D-7423. Effects of nuclear radiation of high-reliability silicon power diode: 4, analysis of reverse bias characteristics [with list of references]; by Julian F. Been.
Publication Title:
Effects of nuclear radiation of high-reliability silicon power diode: 4, analysis of reverse bias characteristics [with list of references]; by Julian F. Been.
Display Title:
NASA technical note TN (series). D-7423. Effects of nuclear radiation of high-reliability silicon power diode: 4, analysis of reverse bias characteristics [with list of references]; by Julian F. Been.
Series Title:
NASA technical note TN (series).
Corporate Agency Authors:
National Aeronautics and Space Administration
Sort Author:
National Aeronautics and Space Administration
Authors:
Been, Julian F.
Author place:
Washington, DC
Author zip:
20546
Date:
Oct. 1973
Publish Date ISO Format:
1973-10-01T00:00:00Z
Publication Start:
19731001
Publication End:
19731031
Corporate/Agency Author:
National Aeronautics and Space Administration
Publication month:
3
Publication year:
1973
SuDoc number:
NAS 1.14:D—(nos.)
Description:
cover title, [1]+33 p. il. 4°
Notes:
@ For Sale by National Technical Information Service, Springfield, VA 22151. Paper, $3.00.
Availability:
@ For Sale by National Technical Information Service, Springfield, VA 22151. Paper, $3.00.