Technical note. 644. Application of non-ideal sliding short to two-port loss measurement [with list of references; by] M. P. Weidman, G. F. Engen.
Publication Title:
Application of non-ideal sliding short to two-port loss measurement [with list of references; by] M. P. Weidman, G. F. Engen.
Display Title:
Technical note. 644. Application of non-ideal sliding short to two-port loss measurement [with list of references; by] M. P. Weidman, G. F. Engen.
Series Title:
Technical note.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Weidman, M. P. and Engen, G. F.
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Oct. 1973
Publish Date ISO Format:
1973-10-01T00:00:00Z
Publication Start:
19731001
Publication End:
19731031
Corporate/Agency Author:
National Bureau of Standards
Publication month:
3
Publication year:
1973
SuDoc number:
C 13.46:644
Description:
iii+34+[1] p. il. 4°
Notes:
(Electromagnetics Division, Institute for Basic Standards.)
Notes:
(Electromagnetics Division, Institute for Basic Standards.) * For Sale by Superintendent of Documents. Paper, 50c. • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, 50c. • Sent to Depository Libraries. Item 249-A