Special publication. 400-5. Semiconductor measurement technology: measurement of transistor scattering parameters (with list of references; by) George J. Rogers, David E. Sawyer, Ramon L. Jesch.
Publication Title:
Semiconductor measurement technology: measurement of transistor scattering parameters (with list of references; by) George J. Rogers, David E. Sawyer, Ramon L. Jesch.
Display Title:
Special publication. 400-5. Semiconductor measurement technology: measurement of transistor scattering parameters (with list of references; by) George J. Rogers, David E. Sawyer, Ramon L. Jesch.
Series Title:
Special publication.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Rogers, George J., Sawyer, David E., and Jesch, Ramon L.
Author place:
Washington, DC
Author zip:
20234
Date:
Jan. 1975
Publish Date ISO Format:
1975-01-01T00:00:00Z
Publication Start:
19750101
Publication End:
19750131
Corporate/Agency Author:
National Bureau of Standards
Publication month:
12
Publication year:
1975
SuDoc number:
C 13.10:400-5
Description:
iv+48+[1] p. il. 4°
Notes:
(Co-sponsored by Air Force Weapons Laboratory.]
Notes:
(Co-sponsored by Air Force Weapons Laboratory.] * For Sale by Superintendent of Documents. Paper, $1.10. • Sent to Depository Libraries. Item 247
Availability:
* For Sale by Superintendent of Documents. Paper, $1.10. • Sent to Depository Libraries. Item 247