NBS special publication. 400-10. Semiconductor measurement technology: Spreading resistance symposium, proceedings of symposium held at National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 [with bibliographies]; James R. Ehrstein, editor.
Publication Title:
Semiconductor measurement technology: Spreading resistance symposium, proceedings of symposium held at National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 [with bibliographies]; James R. Ehrstein, editor.
Display Title:
NBS special publication. 400-10. Semiconductor measurement technology: Spreading resistance symposium, proceedings of symposium held at National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 [with bibliographies]; James R. Ehrstein, editor.
Series Title:
NBS special publication.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Ehrstein, James R.
Author place:
Washington, DC
Author zip:
20234
Date:
Dec. 1974
Publish Date ISO Format:
1974-12-01T00:00:00Z
Publication Start:
19741201
Publication End:
19741231
Corporate/Agency Author:
National Bureau of Standards
Publication month:
1
Publication year:
1974
SuDoc number:
C 13.10:400-10
Description:
ix+281+[1] p. il. 4°
Notes:
([STP 572]; Electronic Technology Division, Institute for Applied Technology.) (Sponsored in cooperation with Committee F-1 of American Society for Testing and Materials.]
Notes:
([STP 572]; Electronic Technology Division, Institute for Applied Technology.) (Sponsored in cooperation with Committee F-1 of American Society for Testing and Materials.] * For Sale by Superintendent of Documents. Paper, $3.55 (S/N 0303-01358). • Sent to Depository Libraries. Item 247
Availability:
* For Sale by Superintendent of Documents. Paper, $3.55 (S/N 0303-01358). • Sent to Depository Libraries. Item 247