NBS technical note. 663. Characterization of high frequency probe assembly for integrated circuit measurements [with list of references; by]R. L. Jesch, C. A. Hoer.
Publication Title:
Characterization of high frequency probe assembly for integrated circuit measurements [with list of references; by]R. L. Jesch, C. A. Hoer.
Display Title:
NBS technical note. 663. Characterization of high frequency probe assembly for integrated circuit measurements [with list of references; by]R. L. Jesch, C. A. Hoer.
Series Title:
NBS technical note.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Jesch, R. L. and Hoer, C. A.
Author place:
Washington, DC
Author zip:
20234
Date:
Apr. 1975
Publish Date ISO Format:
1975-04-01T00:00:00Z
Publication Start:
19750401
Publication End:
19750430
Corporate/Agency Author:
National Bureau of Standards
Publication month:
9
Publication year:
1975
SuDoc number:
C 13.46:663
Description:
v+52 p. il. 4°
Notes:
(Electromagnetics Division, Institute for Bask Standards.)
Notes:
(Electromagnetics Division, Institute for Bask Standards.) * For Sale by Superintendent of Documents. Paper, $1.10. • Sent to Depository Libraries. Item 249-A
Availability:
* For Sale by Superintendent of Documents. Paper, $1.10. • Sent to Depository Libraries. Item 249-A