Special publication. 400-9. Semiconductor measurement technology: ARPA/NBS workshop 2, Hermeticity testing for integrated circuits by]Harry A. Schafft.
Publication Title:
Semiconductor measurement technology: ARPA/NBS workshop 2, Hermeticity testing for integrated circuits by]Harry A. Schafft.
Display Title:
Special publication. 400-9. Semiconductor measurement technology: ARPA/NBS workshop 2, Hermeticity testing for integrated circuits by]Harry A. Schafft.
Series Title:
Special publication.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Schafft, Harry A.
Author place:
Gaithersburg, MD
Author zip:
20760
Date:
Dec. 1974
Publish Date ISO Format:
1974-12-01T00:00:00Z
Publication Start:
19741201
Publication End:
19741231
Corporate/Agency Author:
National Bureau of Standards
Publication month:
1
Publication year:
1974
SuDoc number:
C 13.10:400-9
Description:
[4] + 36 + [1] p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Work supported in cooperation with Defense Advanced Research Projects Agency under ARPA order 2397, program code 4D10.]
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Work supported in cooperation with Defense Advanced Research Projects Agency under ARPA order 2397, program code 4D10.] * For Sale by Superintendent of Documents. Paper, $1.00. • Sent to Depository Libraries. Item 247
Availability:
* For Sale by Superintendent of Documents. Paper, $1.00. • Sent to Depository Libraries. Item 247