Special publication. 400-4. Semiconductor measurement technology: combined quarterly report, Oct. 1, 1973-Mar. 31, 1974 [with bibliographies]; W. Murray Builis, editor.
Series Title:
Special publication.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Builis, W. Murray
Author place:
Washington, DC
Author zip:
20234
Date:
Nov. 1974
Publish Date ISO Format:
1974-11-01T00:00:00Z
Publication Start:
19741101
Publication End:
19741130
Corporate/Agency Author:
National Bureau of Standards
Publication month:
2
Publication year:
1974
SuDoc number:
C 13.10:400-4
Description:
x+89+[1] p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly supported with Defense Nuclear Agency, and Defense Advanced Research Projects Agency.]
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Jointly supported with Defense Nuclear Agency, and Defense Advanced Research Projects Agency.] * For Sale by Superintendent of Documents. Paper, $1.70. • Sent to Depository Libraries. Item 247
Availability:
* For Sale by Superintendent of Documents. Paper, $1.70. • Sent to Depository Libraries. Item 247