Special publication. 400-11. Semiconductor measurement technology: BASIC program for calculating Dopant density profiles from capacitance-voltage data [with list of references; by] Richard L. Mattis and Martin G. Buehler.
Publication Title:
Semiconductor measurement technology: BASIC program for calculating Dopant density profiles from capacitance-voltage data [with list of references; by] Richard L. Mattis and Martin G. Buehler.
Display Title:
Special publication. 400-11. Semiconductor measurement technology: BASIC program for calculating Dopant density profiles from capacitance-voltage data [with list of references; by] Richard L. Mattis and Martin G. Buehler.
Series Title:
Special publication.
Corporate Agency Authors:
National Bureau of Standards and Commerce Dept.
Sort Author:
National Bureau of Standards
Authors:
Mattis, Richard L. and Buehler, Martin G.
Author place:
Washington, DC
Author zip:
20234
Date:
June 1975
Publish Date ISO Format:
1975-06-01T00:00:00Z
Publication Start:
19750601
Publication End:
19750630
Corporate/Agency Author:
National Bureau of Standards
Publication month:
7
Publication year:
1975
SuDoc number:
C 13.10:400-11
Description:
v+33+[1].p. il. 4°
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Supported by Defense Advanced Research Projects Agency under ARPA order 2397, program code 4D10.]
Notes:
(Electronic Technology Division, Institute for Applied Technology.) [Supported by Defense Advanced Research Projects Agency under ARPA order 2397, program code 4D10.] * For Sale by Superintendent of Documents. Paper, $1.00. • Sent to Depository Libraries. Item 247
Availability:
* For Sale by Superintendent of Documents. Paper, $1.00. • Sent to Depository Libraries. Item 247